SF300-CWDM

Automatic CWDM Chip Testing System

SF300-CWDM

Automatic CWDM Chip Testing System

Key Features

Total solution(Alignment and Measurement) for CWDM AWG
Scalable structure software
Including AWG analysis software.(TE,TM Analysis)
High speed measurement (above 5nm/Sec, 10pm step @ Santec TLS)
Mueller matrix method(4 state)
Full automatic alignment

Data Sheets

SF300-AWG
Full auto AWG chip tester

Key FuntionDescription
Auto contact±1µm(Z axis)
Auto dimension searchParallel / Chip to Array(FAB) : Th X, Th Y
Auto core to core search±100nm
Auto roll search±0.01°
Key FeatureMin / MaxStandard Deviation
IL repeatability as alignment≤ 0.1dB≤ 0.05dB
Key FeatureRange
Sensing Range0~1mm
Accuracy0.4µm
AxisMotion RangeResolution
Full / Half stepMicro step(1/20)
Input(Left)X±7.5mm0.5µm / 0.25µm0.025µm
Y±10mm0.5µm / 0.25µm0.025µm
Z±25mm2µm / 1µm0.1µm
Th X±10°0.00268° / 0.00134°0.000134°
Th Y±10°0.0012° / 0.0006°0.00006°
Th Z±10°0.0012° / 0.0006°0.00006°
Output
(Right)
X±7.5mm0.5µm / 0.25µm0.025µm
Y±10mm0.5µm / 0.25µm0.025µm
Z±25mm2µm / 1µm0.1µm
Th X±10°0.00268° / 0.00134°0.000134°
Th Y±10°0.0012° / 0.0006°0.00006°
Th Z±10°0.0012° / 0.0006°0.00006°
CenterCenter (Linear)100mm10㎛
Parameter  
Wavelength range1270~1630nm(depend on TLS)
Measurement resolution1pm(depend on TLS)
IL measurement accuracy±0.05dB( 0~20dB device IL)
±0.10dB( 20~40dB device IL)
±0.20dB( 40~60dB device IL)
IL measurement range10dBm ~ -70dBm
IL measurement repeatability±0.01dB
PDL measurement accuracy±0.05dB( 0~20dB device IL)
±0.10dB( 20~40dB device IL)
PDL measurement repeatability±0.015dB
PDL measurement range10dBm ~ -60dBm
Minimum Acquisition time for single wavelength1 msec
Minimum measurement time4 Scanning time(Muller matrix)
* ( 1 + 0.02*# of Channels)
PSG Insertion Loss1.0dB typical
PSG Wavelength dependent Loss0.3dB
PSG State dependent loss(64-States)< 0.1dB
Maximum number of channels256
Analysis ParametersDefine
Center WavelengthDefined as the center of the 3dB passband
Wavelength OffsetDefined as the difference between the ITU Wavelength and Center wavelength
Polarization Dependent WavelengthDefined as the difference between the center wavelengths for TE and TM Polarization
Mininum Insertion LossDefined as the minimum loss within the ITU passband for TE and TM Polarization(all polarization states)
Maximum Insertion LossDefined as the maximum loss within the ITU passband for TE and TM Polarization(all polarization states)
RippleDefined as the difference between Minimum Insertion Loss and Maximum Insertion Loss within ITU passband for all polarization states
Maximum Polarization Dependent LossDefined as the maximum difference in IL between TE and TM polarization within the ITU passband.
Center Polarization Dependent LossDefined as the maximum difference in IL between TE and TM at the center wavelength
UniformityDefined as the maximum difference between maximum Insertion Loss across all channels
Passband 1dB(3dB,10dB,20dB)Defined as the minimum effective bandwidth 1dB (3dB , 10dB , 20dB) down from peak transmission
Adjacent Channel CrosstalkDefined as the difference between maximum loss in passband and maximum transmission in adjacent channel passbands
Non Adjacent CrosstalkDefined as the difference between maximum loss in passband and worst case maximum transmission in all non-adjacent channel paassbands.
Total CrosstalkDefined as the cumulative sum of all adjacent channel and non-adjacent channel crosstalk values , at worst case polarization.
Notice : It is possible to add customized parameter. (User define parameter)

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