SF300-Bonding
Full auto Bonding and Alignment machine for PLC chip
SF300-Bonding
Full auto Bonding and Alignment machine for PLC chip
Key Features
Total solution(Alignment) for PLC chip
Scalable structure software
High Productivity(bonding 200 module for 20 hours)
High Repeatability(+/-0.05dB IL)
Real time source monitoring function.
Full automatic alignment
Data Sheets
SF300-AWG
Full auto AWG chip tester
Key Funtion | Description |
---|---|
Auto contact | ±1µm(Z axis) |
Auto dimension search | Parallel / Chip to Array(FAB) : Th X, Th Y |
Auto core to core search | ±100nm |
Auto roll search | ±0.01° |
Key Feature | Min / Max | Standard Deviation |
---|---|---|
IL repeatability as alignment | ≤ 0.1dB | ≤ 0.05dB |
Key Feature | Range |
---|---|
Sensing Range | 0~1mm |
Accuracy | 0.4µm |
Axis | Motion Range | Resolution | ||
---|---|---|---|---|
Full / Half step | Micro step(1/20) | |||
Input(Left) | X | ±7.5mm | 0.5µm / 0.25µm | 0.025µm |
Y | ±10mm | 0.5µm / 0.25µm | 0.025µm | |
Z | ±25mm | 2µm / 1µm | 0.1µm | |
Th X | ±10° | 0.00268° / 0.00134° | 0.000134° | |
Th Y | ±10° | 0.0012° / 0.0006° | 0.00006° | |
Th Z | ±10° | 0.0012° / 0.0006° | 0.00006° | |
Output (Right) | X | ±7.5mm | 0.5µm / 0.25µm | 0.025µm |
Y | ±10mm | 0.5µm / 0.25µm | 0.025µm | |
Z | ±25mm | 2µm / 1µm | 0.1µm | |
Th X | ±10° | 0.00268° / 0.00134° | 0.000134° | |
Th Y | ±10° | 0.0012° / 0.0006° | 0.00006° | |
Th Z | ±10° | 0.0012° / 0.0006° | 0.00006° | |
Center | Center (Linear) | 100mm | 10㎛ |
Parameter | |
---|---|
Wavelength range | 1270~1630nm(depend on TLS) |
Measurement resolution | 1pm(depend on TLS) |
IL measurement accuracy | ±0.05dB( 0~20dB device IL) |
±0.10dB( 20~40dB device IL) | |
±0.20dB( 40~60dB device IL) | |
IL measurement range | 10dBm ~ -70dBm |
IL measurement repeatability | ±0.01dB |
PDL measurement accuracy | ±0.05dB( 0~20dB device IL) |
±0.10dB( 20~40dB device IL) | |
PDL measurement repeatability | ±0.015dB |
PDL measurement range | 10dBm ~ -60dBm |
Minimum Acquisition time for single wavelength | 1 msec |
Minimum measurement time | 4 Scanning time(Muller matrix) |
* ( 1 + 0.02*# of Channels) | |
PSG Insertion Loss | 1.0dB typical |
PSG Wavelength dependent Loss | 0.3dB |
PSG State dependent loss(64-States) | < 0.1dB |
Maximum number of channels | 256 |
Analysis Parameters | Define |
---|---|
Center Wavelength | Defined as the center of the 3dB passband |
Wavelength Offset | Defined as the difference between the ITU Wavelength and Center wavelength |
Polarization Dependent Wavelength | Defined as the difference between the center wavelengths for TE and TM Polarization |
Mininum Insertion Loss | Defined as the minimum loss within the ITU passband for TE and TM Polarization(all polarization states) |
Maximum Insertion Loss | Defined as the maximum loss within the ITU passband for TE and TM Polarization(all polarization states) |
Ripple | Defined as the difference between Minimum Insertion Loss and Maximum Insertion Loss within ITU passband for all polarization states |
Maximum Polarization Dependent Loss | Defined as the maximum difference in IL between TE and TM polarization within the ITU passband. |
Center Polarization Dependent Loss | Defined as the maximum difference in IL between TE and TM at the center wavelength |
Uniformity | Defined as the maximum difference between maximum Insertion Loss across all channels |
Passband 1dB(3dB,10dB,20dB) | Defined as the minimum effective bandwidth 1dB (3dB , 10dB , 20dB) down from peak transmission |
Adjacent Channel Crosstalk | Defined as the difference between maximum loss in passband and maximum transmission in adjacent channel passbands |
Non Adjacent Crosstalk | Defined as the difference between maximum loss in passband and worst case maximum transmission in all non-adjacent channel paassbands. |
Total Crosstalk | Defined as the cumulative sum of all adjacent channel and non-adjacent channel crosstalk values , at worst case polarization. |
Notice : It is possible to add customized parameter. (User define parameter) |
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